US 11,726,008 B2
Virtualized automated test equipment and methods for designing such systems
Christopher Bakker, East Hampton, MA (US); Roy Dennis Walker, Chesterfield, MA (US); and Burt Snover, Florence, MA (US)
Assigned to TECH180 CORPORATION, East Hampton, MA (US)
Filed by TECH180 CORPORATION, East Hampton, MA (US)
Filed on Dec. 9, 2021, as Appl. No. 17/546,366.
Application 17/546,366 is a continuation of application No. 16/918,461, filed on Jul. 1, 2020, granted, now 11,226,267.
Claims priority of provisional application 62/892,481, filed on Aug. 27, 2019.
Prior Publication US 2022/0099535 A1, Mar. 31, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 11/30 (2006.01); G01M 99/00 (2011.01)
CPC G01M 99/005 (2013.01) 18 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a first slice defined within a virtualizable automated test equipment architecture, the first slice comprising:
a first plurality of signal paths;
a first impedance disposed along at least one signal path of the plurality of signal paths;
a first plurality of configurable disconnects, the first plurality of configurable disconnects being configured to open or close at least one of the first plurality of signal paths;
a second slice defined within the virtualizable automated test equipment architecture, the second slice comprising:
a second plurality of signal paths;
a second impedance disposed along at least one signal path of the second plurality of signal paths;
a second plurality of configurable disconnects, the second plurality of configurable disconnects being configured to open or close at least one signal path of the second plurality of signal paths;
a controller configured to be coupled to the first plurality of configurable disconnects and second plurality of configurable disconnects, wherein the controller is configured to control a state of the first and second plurality of configurable disconnects such that at least one of the slices is configured to operate in one of a simulation mode, a data acquisition mode, an instrument mode, a fault mode, or a real source connect mode.