CPC B22F 10/85 (2021.01) [B22F 10/28 (2021.01); B23K 26/0093 (2013.01); B23K 26/342 (2015.10); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 21/8851 (2013.01); G06T 7/001 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30136 (2013.01)] | 10 Claims |
1. A method of additive manufacturing comprising the steps of:
forming a first product with an additive manufacturing device by adding sequential layers of material on top of one another, including, as each sequential layer of material is added:
monitoring the sequential layer with a defect analysis subsystem to detect whether the sequential layer has any defects;
for a detected first defect, determining whether defect correction is required;
for a required defect correction, identifying one or more correction parameters for the required defect correction; and
sending a correction command with the one or more correction parameters to the additive manufacturing device, the correction command causing the additive manufacturing device to perform a correction procedure to the detected first defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer;
forming a second product according to the steps of forming the first product, wherein the second product includes the same specifications as the first product, and wherein the defect analysis subsystem detects a second defect in the second product;
comparing the detected first defect in the first product and the detected second defect in the second product; and
calibrating the additive manufacturing method based on the comparison of the detected first defect in the first product and the detected second defect in the second product.
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10. A method of additive manufacturing comprising the steps of:
forming a first product with an additive manufacturing device by adding sequential layers of material on top of one another including for at least one of the sequential layers of material:
monitoring the sequential layer as it is being added with a defect analysis subsystem to detect a first defect;
determining that a defect correction is required to repair the first defect;
identifying one or more correction parameters for the defect correction; and
sending a correction command with the one or more correction parameters to the additive manufacturing device, the correction command causing the additive manufacturing device to perform a correction procedure to the detected first defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer;
forming a second product according to the steps of forming the first product, wherein the second product includes the same specifications as the first product, and wherein the defect analysis subsystem detects a second defect in the second product;
comparing the detected first defect in the first product and the detected second defect in the second product; and
calibrating the additive manufacturing method based on the comparison of the detected first defect in the first product and the detected second defect in the second product.
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