US 11,724,315 B2
Systems and methods for defect detection and correction in additive manufacturing processes
Jingfu Liu, Prior Lake, MN (US); Behrooz Jalalahmadi, Long Island City, NY (US); Ziye Liu, West Lafayette, IN (US); Andrew Vechart, Minnetrista, MN (US); and Xiawa Wu, Erie, PA (US)
Assigned to Sentient Science Corporation, Buffalo, NY (US)
Filed by Sentient Science Corporation, Buffalo, NY (US)
Filed on Sep. 2, 2020, as Appl. No. 17/9,945.
Prior Publication US 2022/0062997 A1, Mar. 3, 2022
Int. Cl. B22F 10/85 (2021.01); G01N 21/88 (2006.01); B23K 26/342 (2014.01); G06T 7/00 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B23K 26/00 (2014.01); B22F 10/28 (2021.01)
CPC B22F 10/85 (2021.01) [B22F 10/28 (2021.01); B23K 26/0093 (2013.01); B23K 26/342 (2015.10); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 21/8851 (2013.01); G06T 7/001 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30136 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A method of additive manufacturing comprising the steps of:
forming a first product with an additive manufacturing device by adding sequential layers of material on top of one another, including, as each sequential layer of material is added:
monitoring the sequential layer with a defect analysis subsystem to detect whether the sequential layer has any defects;
for a detected first defect, determining whether defect correction is required;
for a required defect correction, identifying one or more correction parameters for the required defect correction; and
sending a correction command with the one or more correction parameters to the additive manufacturing device, the correction command causing the additive manufacturing device to perform a correction procedure to the detected first defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer;
forming a second product according to the steps of forming the first product, wherein the second product includes the same specifications as the first product, and wherein the defect analysis subsystem detects a second defect in the second product;
comparing the detected first defect in the first product and the detected second defect in the second product; and
calibrating the additive manufacturing method based on the comparison of the detected first defect in the first product and the detected second defect in the second product.
 
10. A method of additive manufacturing comprising the steps of:
forming a first product with an additive manufacturing device by adding sequential layers of material on top of one another including for at least one of the sequential layers of material:
monitoring the sequential layer as it is being added with a defect analysis subsystem to detect a first defect;
determining that a defect correction is required to repair the first defect;
identifying one or more correction parameters for the defect correction; and
sending a correction command with the one or more correction parameters to the additive manufacturing device, the correction command causing the additive manufacturing device to perform a correction procedure to the detected first defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer;
forming a second product according to the steps of forming the first product, wherein the second product includes the same specifications as the first product, and wherein the defect analysis subsystem detects a second defect in the second product;
comparing the detected first defect in the first product and the detected second defect in the second product; and
calibrating the additive manufacturing method based on the comparison of the detected first defect in the first product and the detected second defect in the second product.