CPC H02P 25/034 (2016.02) [G08B 6/00 (2013.01)] | 26 Claims |
1. A measurement circuit, comprising:
a first transistor configured to drive a first node of a haptic load;
a second transistor having a gate connected to a gate of the first transistor and a drain connected to a first reference current;
a first comparator having a first node connected, in parallel, to the drain of the second transistor, and having a second node connected to the first node of the haptic load, wherein the first comparator triggers when a voltage driving the haptic load satisfies a first condition;
a third transistor configured to drive a second node of the haptic load;
a fourth transistor having a gate connected to a gate of the third transistor and a drain connected to a second reference current; and
a second comparator having a first node connected, in parallel, to the drain of the fourth transistor, and having a second node connected to the second node of the haptic load, wherein the second comparator triggers when the voltage driving the haptic load satisfies a second condition.
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