US 11,721,409 B2
Smart sampling for block family scan
Vamsi Pavan Rayaprolu, Santa Clara, CA (US); Shane Nowell, Boise, ID (US); Michael Sheperek, Longmont, CO (US); and Steven Michael Kientz, Westminster, CO (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by MICRON TECHNOLOGY, INC., Boise, ID (US)
Filed on Jul. 29, 2022, as Appl. No. 17/877,810.
Application 17/877,810 is a continuation of application No. 17/125,895, filed on Dec. 17, 2020, granted, now 11,404,139.
Prior Publication US 2022/0366997 A1, Nov. 17, 2022
Int. Cl. G11C 16/34 (2006.01); G11C 29/44 (2006.01); G11C 29/42 (2006.01); G11C 29/12 (2006.01); G11C 29/10 (2006.01)
CPC G11C 29/44 (2013.01) [G11C 16/349 (2013.01); G11C 29/10 (2013.01); G11C 29/12015 (2013.01); G11C 29/42 (2013.01); G11C 2207/2254 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
determining a calibration scan frequency based on an amount of elapsed time since a previous write operation was performed on the memory device;
determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied;
responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families; and
scanning one or more bin pointers of each of the identified one or more block families, wherein the scanning the one or more bin pointers comprises: for each of the identified one or more block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.