CPC G06F 11/26 (2013.01) [G06F 11/2221 (2013.01); G08B 1/08 (2013.01); G08B 5/22 (2013.01); G05B 15/02 (2013.01); G08B 29/14 (2013.01); G08B 29/16 (2013.01); G08B 29/18 (2013.01)] | 15 Claims |
1. A controller for event input device testing, comprising:
a memory; and
a processor configured to execute executable instructions stored in the memory to:
cause a first event input device of a group of event input devices to perform an automated test process as part of an automated test analysis according to a predetermined test sequence, wherein while the first event input device is performing the automated test process, the first event input device is in a test mode and other event input devices of the group of event input devices, including a second event input device, are in an active mode;
determine whether the second event input device of the group of event input devices has detected a hazard event while the first event input device is performing the automated test process;
cause, in response to determining the second event input device has detected a hazard event while the first event input device is performing the automated test process, the first event input device to:
cease performing the automated test process; and
revert from the test mode to the active mode in response to determining the second event input device has detected the hazard event while the first event input device is performing the automated test process;
cause, according to the predetermined test sequence, the second event input device to perform an automated test process as part of the automated test analysis, wherein while the second event input device is performing the automated test process, the second event input device is in a test mode and other event input devices of the group of event input devices, including the first event input device, are in the active mode; and
determine whether the first event input device has detected a hazard event while the second event input device is performing the automated test process.
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