US 11,719,765 B2
Sensor for measuring a magnetic field
Tim Schröder, Berlin (DE); Felipe Perona Martinez, Berlin (DE); Julian Bopp, Berlin (DE); Moritz Kleinert, Berlin (DE); and Hauke Conradi, Berlin (DE)
Assigned to Humboldt-Universität zu Berlin, Berlin (DE); and Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V., Munich (DE)
Filed by Humboldt-Universität zu Berlin, Berlin (DE); and Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., Munich (DE)
Filed on May 6, 2022, as Appl. No. 17/739,066.
Claims priority of application No. 21177745 (EP), filed on Jun. 4, 2021.
Prior Publication US 2022/0390529 A1, Dec. 8, 2022
Int. Cl. G01R 33/32 (2006.01); G01R 33/032 (2006.01); G01R 33/02 (2006.01)
CPC G01R 33/032 (2013.01) [G01R 33/0206 (2013.01)] 17 Claims
OG exemplary drawing
 
1. Sensor comprising a sensor element (10) for measuring a magnetic field, the sensor element (10) comprising
a set of at least two first input ports (I1),
a set of at least two exit ports (E) each of which is connected to one of the first input ports (I1) via a corresponding first beam path (B1),
a set of at least two second input ports (I2) each of which is connected to a second beam path (B2),
wherein the first beam paths (B1) extend through a common plane (CP) located inside the sensor element (10), said plane (CP) comprising a plurality of magneto-optically responsive defect centers,
wherein the second beam paths (B2) also extend through said common plane (CP), but are angled with respect to the first beam paths (B1) such that a plurality of intersections between the first and second beam paths (B2) is defined, and
wherein each intersection forms a sensor pixel (P) located at at least one of said magneto-optically responsive defect centers.