US 11,719,740 B2
Test fixture for printed circuit board components
Biswadeep Das Gupta, Noblesville, IN (US); Syed An Nazmus Saqueb, Westfield, IN (US); Ridhwan Khalid Mirza, Kokomo, IN (US); and Sophie Macfarland, Carmel, IN (US)
Assigned to Aptiv Technologies Limited, St. Michael (BB)
Filed by Aptiv Technologies Limited, St. Michael (BB)
Filed on Mar. 23, 2022, as Appl. No. 17/656,205.
Claims priority of provisional application 63/265,029, filed on Dec. 6, 2021.
Prior Publication US 2023/0176109 A1, Jun. 8, 2023
Int. Cl. G01R 31/20 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/20 (2006.01); G01R 29/08 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/2808 (2013.01) 20 Claims
OG exemplary drawing
 
1. A test fixture configured to test at least one component of a printed circuit board (PCB), the test fixture comprising:
a shim that provides an end having a thickness that corresponds to a thickness of the PCB proximal an end of the PCB, the end of the shim providing an aperture configured to direct RF energy from the component, via the end of the PCB, and to a top clamp of the test fixture;
the top clamp that provides:
a standard test port of the test fixture configured to test the component; and
a taper configured to direct the RF energy from the aperture of the shim and to the standard test port; and
a bottom clamp configured to be attached to the top clamp to retain the PCB between the top clamp and the bottom clamp for testing.