CPC B23B 47/288 (2013.01) [G01M 5/0033 (2013.01); G01N 3/08 (2013.01)] | 14 Claims |
1. A test fixture for conducting a Double Cantilever Beam (DCB) test comprising:
upper and lower pin block hangers adapted to receive an applied fracturing load; and
at least two rotating pin blocks, each of the at least two rotating pin blocks including a specimen pin and a hanger full-round pin, each specimen pin substantially parallel to a corresponding full-round pin, each specimen pin being a specimen half-round pin or a specimen full-round pin, each hanger full-round pin adapted to rotationally mechanically couple to a corresponding one of the upper and lower pin block hangers, each specimen pin adapted to rotationally mechanically couple to a DCB specimen;
wherein the applied fracturing load is transferred from the upper and lower pin block hangers to the DCB specimen via the at least two rotating pin blocks; and
wherein the DCB specimen has a single hole, the single hole adapted to receive each specimen pin.
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