US 11,714,132 B2
Test equipment diagnostics systems and methods
Mei-Mei Su, Mountain View, CA (US); and Seth Craighead, San Jose, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Mar. 31, 2021, as Appl. No. 17/219,297.
Claims priority of provisional application 63/002,710, filed on Mar. 31, 2020.
Prior Publication US 2021/0302501 A1, Sep. 30, 2021
Int. Cl. G01R 31/319 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/31908 (2013.01) [G01R 31/2875 (2013.01); G01R 31/31905 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A test equipment diagnostic method comprising:
applying a known first bit pattern to a test equipment component, wherein the first bit pattern has a known thermal load and corresponding first known temperature;
applying a known second bit pattern to a test equipment component, wherein the first bit pattern and second bit pattern are different the second bit pattern has a known thermal load and corresponding second known temperature; and
performing a test equipment temperature control analysis based upon the results of applying the known first bit pattern and known second bit pattern, wherein performing the test equipment temperature control analysis includes determining if temperature control components control a temperature of the test equipment, including comparing a known temperature delta to a measured temperature delta.