US 11,714,124 B2
Electronic component handling apparatus and electronic component testing apparatus
Hiromitsu Horino, Tokyo (JP); Yoshitaka Takeuchi, Tokyo (JP); Yoshinori Arai, Tokyo (JP); and Hiroyuki Kikuchi, Tokyo (JP)
Assigned to ADVANTEST Corporation, Tokyo (JP)
Filed by ADVANTEST Corporation, Tokyo (JP)
Filed on Jun. 25, 2021, as Appl. No. 17/358,414.
Claims priority of application No. 2020-124724 (JP), filed on Jul. 21, 2020.
Prior Publication US 2022/0026486 A1, Jan. 27, 2022
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2893 (2013.01) [G01R 31/2887 (2013.01)] 18 Claims
OG exemplary drawing
 
1. An electronic component handling apparatus that handles a device under test (DUT), the electronic component handling apparatus comprising:
multiple transfer units that each comprise a DUT transfer part that mounts the DUT on a first tray or that removes the DUT from the first tray;
multiple contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and
a tray transporter that transports the first tray between the multiple contact units and the multiple transfer units, wherein
at least one of the multiple transfer units is removably disposed on the electronic component handling apparatus.