US 11,714,004 B2
Measurements using systems having multiple spectrometers
James Eilertsen, Zurich (CH); and Javier Miguel Sánchez, Zurich (CH)
Assigned to AMS Sensors Singapore Pte. Ltd., Singapore (SG)
Appl. No. 17/289,299
Filed by ams Sensors Singapore Pte. Ltd., Singapore (SG)
PCT Filed Nov. 13, 2019, PCT No. PCT/SG2019/050558
§ 371(c)(1), (2) Date Apr. 28, 2021,
PCT Pub. No. WO2020/101575, PCT Pub. Date May 22, 2020.
Claims priority of provisional application 62/767,876, filed on Nov. 15, 2018.
Prior Publication US 2021/0389179 A1, Dec. 16, 2021
Int. Cl. G01J 3/42 (2006.01); G01J 3/02 (2006.01)
CPC G01J 3/42 (2013.01) [G01J 3/0272 (2013.01); G01J 2003/425 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a first spectrometer comprising:
a first light source comprising one or more light-emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSELs), organic LEDs, or combinations thereof;
a first photodetector;
a second spectrometer comprising:
a second light source comprising one or more light-emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSELs), organic LEDs, or combinations thereof;
a second photodetector; and
an electronic control device communicatively coupled to the first spectrometer and the second spectrometer,
wherein the first light source is operable to emit first light towards a sample region between the first spectrometer and the second spectrometer, wherein the first light emitted from the first light source is ultraviolet light, visible light, or infrared light,
wherein the first photodetector is operable to measure first reflected light reflected from an object in the sample region,
wherein the second photodetector is operable to measure first transmitted light transmitted through the object, and
wherein the electronic control device is operable to determine, based on at least one of the measured first reflected light or the measured first transmitted light, a spectral distribution of light corresponding to the object.