CPC H01J 49/0459 (2013.01) [A61B 5/14503 (2013.01); A61B 5/7282 (2013.01); A61B 10/02 (2013.01); A61F 13/38 (2013.01); G01N 30/72 (2013.01); H01J 49/0409 (2013.01); H01J 49/165 (2013.01); G01N 2001/028 (2013.01)] | 11 Claims |
1. A method for analyzing a sample, the method comprising:
contacting a distal portion of a probe to a sample such that a portion of the sample is retained on the distal portion of the probe;
positioning the distal portion of the probe directly vertically above a distal end of an upward opening inlet of a mass spectrometer;
applying solvent and voltage to the probe to generate ions of the sample that are downwardly expelled from the probe and into the inlet of the mass spectrometer; and
analyzing the ions in the mass spectrometer, thereby analyzing the sample.
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