US 11,710,626 B2
Systems and methods for sample analysis using swabs
Robert Graham Cooks, West Lafayette, IN (US); Alan Keith Jarmusch, Lafayette, IN (US); and Valentina Pirro, West Lafayette, IN (US)
Assigned to Purdue Research Foundation, West Lafayette, IN (US)
Filed by Purdue Research Foundation, West Lafayette, IN (US)
Filed on Apr. 5, 2021, as Appl. No. 17/222,194.
Application 17/222,194 is a continuation of application No. 16/101,647, filed on Aug. 13, 2018, granted, now 10,998,178.
Claims priority of provisional application 62/550,927, filed on Aug. 28, 2017.
Prior Publication US 2022/0005681 A1, Jan. 6, 2022
Int. Cl. G01N 30/72 (2006.01); H01J 49/04 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01); H01J 49/16 (2006.01); A61F 13/38 (2006.01); A61B 10/02 (2006.01); G01N 1/02 (2006.01)
CPC H01J 49/0459 (2013.01) [A61B 5/14503 (2013.01); A61B 5/7282 (2013.01); A61B 10/02 (2013.01); A61F 13/38 (2013.01); G01N 30/72 (2013.01); H01J 49/0409 (2013.01); H01J 49/165 (2013.01); G01N 2001/028 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A method for analyzing a sample, the method comprising:
contacting a distal portion of a probe to a sample such that a portion of the sample is retained on the distal portion of the probe;
positioning the distal portion of the probe directly vertically above a distal end of an upward opening inlet of a mass spectrometer;
applying solvent and voltage to the probe to generate ions of the sample that are downwardly expelled from the probe and into the inlet of the mass spectrometer; and
analyzing the ions in the mass spectrometer, thereby analyzing the sample.