CPC G01Q 20/02 (2013.01) [G01Q 10/04 (2013.01); G06T 7/70 (2017.01); G06T 2207/20081 (2013.01)] | 13 Claims |
1. An atomic force microscope comprising:
a sample stage configured to allow a sample to be placed thereon;
a cantilever disposed above the sample, the cantilever including a probe tip;
a laser configured to radiate a laser beam to the cantilever;
a photodetector configured to receive a laser beam reflected from the cantilever;
a first camera configured to photograph the sample and the cantilever;
a second camera configured to photograph the cantilever and a spot of a laser beam radiated from the laser; and
a processor electrically connected to the first camera, the second camera, and the photodetector, the processor processing data acquired by the first camera, the second camera, and the photodetector.
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