US 11,704,047 B2
Temperature readings for memory devices to reduce temperature compensation errors
Agostino Macerola, San Benedetto dei Marsi (IT); Michele Piccardi, Cupertino, CA (US); Umberto Siciliani, Rubano (IT); Tommaso Vali, Sezze (IT); and Enrico Favaro, Scorzè (IT)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Nov. 29, 2021, as Appl. No. 17/536,465.
Claims priority of provisional application 63/212,273, filed on Jun. 18, 2021.
Prior Publication US 2022/0405002 A1, Dec. 22, 2022
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0653 (2013.01) [G06F 3/0604 (2013.01); G06F 3/0673 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A memory device comprising:
a memory array;
a thermometer; and
control logic, operatively coupled with the memory array and the thermometer, to perform operations comprising:
causing the thermometer to obtain a first temperature result;
monitoring a time since obtaining the first temperature result;
determining whether the time satisfies a threshold time condition;
in response to determining that the time satisfies the threshold time condition, causing the thermometer to obtain a second temperature result from an automatic temperature reading;
determining a difference between the second temperature result and a previously stored temperature result; and
filtering the second temperature result based on the difference to obtain a new stored temperature result.