CPC G01R 31/31721 (2013.01) [G01R 31/3187 (2013.01)] | 20 Claims |
7. A method for testing an integrated circuit, whereby the method comprises:
receiving an input signal at a receive unit to be tested, and storing the input signal at a predetermined point in time;
providing a filtered input signal based on the input signal;
applying an error correction to the input signal, thereby generating an error corrected signal;
comparing the error corrected signal with an expectation value;
outputting an error message when the filtered input signal does not correspond to the expectation value;
supplying the receive unit to be tested with an adjustable voltage or an adjustable current; and
varying the predetermined point in time and the adjustable voltage or the adjustable current.
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