US 11,703,324 B2
Apparatus, systems, and methods for the laser inspection of holes in transparent materials
Roger W. Engelbart, St. Louis, MO (US); Elizabeth Ann Paton, St. Louis, MO (US); and Christopher M. Vaccaro, O'Fallon, MO (US)
Assigned to The Boeing Company, Chicago, IL (US)
Filed by The Boeing Company, Chicago, IL (US)
Filed on Nov. 9, 2021, as Appl. No. 17/522,846.
Claims priority of provisional application 63/112,099, filed on Nov. 10, 2020.
Prior Publication US 2022/0146256 A1, May 12, 2022
Int. Cl. G01B 11/30 (2006.01); G01N 21/954 (2006.01); G01N 21/958 (2006.01)
CPC G01B 11/303 (2013.01) [G01N 21/954 (2013.01); G01N 21/958 (2013.01); G01N 2201/06113 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An inspection apparatus, comprising:
a processor;
an illumination probe, the illumination probe including:
a first reflective surface configured to be inserted into a first fastener hole formed in a transparent material;
a laser light source configured to direct laser light into the first fastener hole so that the laser light is incident upon the first reflective surface within the first fastener hole, such that at least a portion of the incident laser light is reflected by the first reflective surface through a wall of the first fastener hole and into the transparent material; and
a detection probe, the detection probe including:
a photodetector positioned to detect laser light directed from a second fastener hole formed in the transparent material adjacent to the first fastener hole and transmit a corresponding light intensity value to the processor; and
a second reflective surface configured to be inserted into the second fastener hole and oriented such that laser light reflected from the first reflective surface that passes through the wall of the first fastener hole and through a wall of the second fastener hole to strike the second reflective surface is reflected toward the photodetector, and
wherein the processor is configured to receive the corresponding light intensity value and compare the corresponding light intensity value to a standard intensity value.