US 11,693,065 B2
System and method for measuring second order and higher gradients
Joshua Javor, Cambridge, MA (US); David Bishop, Brookline, MA (US); David Campbell, Brookline, MA (US); and Matthias Imboden, St. Blaise (CH)
Assigned to Trustees of Boston University, Boston, MA (US)
Filed by Trustees of Boston University, Boston, MA (US)
Filed on Mar. 11, 2022, as Appl. No. 17/692,651.
Claims priority of provisional application 63/300,858, filed on Jan. 19, 2022.
Claims priority of provisional application 63/300,907, filed on Jan. 19, 2022.
Claims priority of provisional application 63/159,829, filed on Mar. 11, 2021.
Prior Publication US 2022/0291300 A1, Sep. 15, 2022
Int. Cl. G01R 33/022 (2006.01); G01R 33/038 (2006.01); G01R 33/00 (2006.01)
CPC G01R 33/022 (2013.01) [G01R 33/0052 (2013.01); G01R 33/038 (2013.01); G01R 33/0385 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A gradiometer for measuring a gradient of an external magnetic field comprising:
a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis, the first magnet and the second magnet being positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions, wherein the first magnet and the second magnet are configured to move along the polarization axis in response to the external magnetic field;
a sensing system configured to measure a change in the gradient of the external magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the external magnetic field.