US 11,692,928 B2
Particle analysis using light microscope and multi-pixel polarization filter
Indrajati Nicole Kastanja, Olching (DE); Markus Cappellaro, Munich (DE); and Achim Schwarz, Taufkirchen (DE)
Assigned to Carl Zeiss Microscopy GmbH, Jena (DE)
Filed by Carl Zeiss Microscopy GmbH, Jena (DE)
Filed on Jan. 26, 2021, as Appl. No. 17/158,572.
Claims priority of application No. 102020102419.3 (DE), filed on Jan. 31, 2020.
Prior Publication US 2021/0239596 A1, Aug. 5, 2021
Int. Cl. G01N 15/14 (2006.01); G02B 21/00 (2006.01)
CPC G01N 15/1475 (2013.01) [G02B 21/0032 (2013.01); G01N 2015/1493 (2013.01); G01N 2015/1497 (2013.01)] 9 Claims
OG exemplary drawing
 
1. An optical system, comprising:
a sample holder configured to fix a sample object,
a light microscope, which defines an illumination light path and a detection light path for microscopy of the sample object with polarized light,
at least one camera comprising a multi-pixel detector having a multiplicity of detector pixel elements, and a multi-pixel polarization filter having a multiplicity of polarization filter pixel elements, wherein the multi-pixel polarization filter is arranged between the sample holder and the multi-pixel detector in the detection light path, wherein the multi-pixel detector is configured to provide image data, wherein the at least one camera furthermore comprises a multi-pixel spectral filter having a multiplicity of spectral filter pixel elements, which is arranged upstream of the multi-pixel detector in the detection light path, and
a computer logic element configured to calculate at least one polarization image of the sample object on the basis of the image data,
wherein the computer logic element is furthermore configured to carry out a particle analysis for a surface of the sample object on the basis of the at least one polarization image.