US 11,686,766 B2
Built-in self-test circuit and temperature measurement circuit including the same
Junhee Shin, Yongin-si (KR); Jooseong Kim, Seoul (KR); Yongjin Lee, Goyang-si (KR); Michael Choi, Seoul (KR); Kwangho Kim, Yongin-si (KR); and Sangho Kim, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD.
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jul. 28, 2020, as Appl. No. 16/940,809.
Claims priority of application No. 10-2019-0175903 (KR), filed on Dec. 27, 2019.
Prior Publication US 2021/0199719 A1, Jul. 1, 2021
Int. Cl. G01R 31/317 (2006.01); G01R 31/28 (2006.01); G01R 31/3167 (2006.01); H03K 19/017 (2006.01); G01R 31/30 (2006.01); G01R 31/327 (2006.01); G01R 31/319 (2006.01)
CPC G01R 31/31724 (2013.01) [G01R 31/2874 (2013.01); G01R 31/3004 (2013.01); G01R 31/3167 (2013.01); G01R 31/31924 (2013.01); G01R 31/3274 (2013.01); H03K 19/01721 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A temperature measurement circuit comprising:
a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature;
a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage;
a sensing circuit configured to generate a temperature-variant voltage based on a bias current, wherein the temperature-variant voltage is varied depending on the operation temperature;
an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage; and
an analog built-in self-test (BIST) circuit configured to generate
a first flag signal indicating whether the band-gap reference voltage is within a first predetermined range,
a second flag signal indicating whether the measurement reference voltage is within a second predetermined range, and
a third flag signal indicating whether a bias voltage corresponding to the bias current is within a third predetermined range.