CPC G01R 31/31724 (2013.01) [G01R 31/2874 (2013.01); G01R 31/3004 (2013.01); G01R 31/3167 (2013.01); G01R 31/31924 (2013.01); G01R 31/3274 (2013.01); H03K 19/01721 (2013.01)] | 20 Claims |
1. A temperature measurement circuit comprising:
a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature;
a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage;
a sensing circuit configured to generate a temperature-variant voltage based on a bias current, wherein the temperature-variant voltage is varied depending on the operation temperature;
an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage; and
an analog built-in self-test (BIST) circuit configured to generate
a first flag signal indicating whether the band-gap reference voltage is within a first predetermined range,
a second flag signal indicating whether the measurement reference voltage is within a second predetermined range, and
a third flag signal indicating whether a bias voltage corresponding to the bias current is within a third predetermined range.
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