US 11,680,984 B1
Control data registers for scan testing
Wilson Pradeep, Bangalore (IN); Aravinda Acharya, Bangalore (IN); and Nikita Naresh, Bangalore (IN)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Feb. 28, 2022, as Appl. No. 17/683,126.
Int. Cl. G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); G01R 31/3177 (2006.01)
CPC G01R 31/318536 (2013.01) [G01R 31/3177 (2013.01); G01R 31/31727 (2013.01); G01R 31/31926 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A circuit, comprising:
a custom control data register (CCDR) circuit having a scan path, the CCDR circuit comprising:
a shift register configured to:
receive scan data from a scan data input (CDR_SCAN_IN) on a first clock edge responsive to a scan enable signal (CDR_SCAN_EN) being enabled; and
an update register configured to:
receive data from the shift register on a second clock edge after the first clock edge when the scan enable signal (CDR_SCAN_EN) is enabled,
the update register data being asserted as a scan data output (CDR_SCAN_OUT), and
wherein the scan path includes the scan data input, the shift register, the update register, and the scan data output.