CPC G01R 31/3177 (2013.01) [G01R 31/3008 (2013.01); G01R 31/31721 (2013.01); G01R 31/31725 (2013.01)] | 20 Claims |
1. An apparatus for testing a device under test (DUT), comprising:
a power supply device configured to provide a first voltage and a second voltage to the DUT;
a clock device; and
a data generating device configured to provide first data to the DUT, wherein
the power supply device is configured to provide the first voltage to the DUT in a first time duration;
the data generating device is configured to provide the first data to the DUT in the first time duration;
the power supply device is configured to provide the second voltage to the DUT in a second time duration after the first time duration;
the clock device is configured to provide a clock signal to the DUT in the first time duration and stop providing the clock signal to the DUT in the second time duration; and
the second voltage is different from the first voltage, wherein the DUT comprises a first number of information storage units connected in series, and the first data comprises a second number of bits, wherein the second number is identical to the first number.
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