US 11,675,002 B2
Terahertz plasmonics for testing very large-scale integrated circuits under bias
Greg Rupper, Silver Spring, MD (US); John Suarez, Brooklyn, NY (US); Sergey Rudin, Dayton, MD (US); Meredith Reed, Perry Hall, MD (US); and Michael Shur, Latham, NY (US)
Assigned to The Government of the United States, as represented by the Secretary of the Army, Washington, DC (US)
Filed by The Government of the United States, as represented by the Secretary of the Army, Washington, DC (US)
Filed on Dec. 15, 2020, as Appl. No. 17/121,851.
Application 17/121,851 is a division of application No. 15/437,713, filed on Feb. 21, 2017, granted, now 10,890,618.
Prior Publication US 2022/0011363 A1, Jan. 13, 2022
Int. Cl. G01R 31/311 (2006.01); G01R 31/265 (2006.01); G01R 31/3185 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/311 (2013.01) [G01R 31/2656 (2013.01); G01R 31/2815 (2013.01); G01R 31/318533 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system, comprising:
an analysis component configured to perform a first analysis on a response produced by an emission of a radiation upon a first integrated circuit; and
a determination component configured to determine a health of the first integrated circuit based, at least in part, on a result of the analysis,
a selection component configured to make a selection between the first integrated circuit and a second integrated circuit,
where the analysis component is configured to perform a second analysis on a response produced by an emission of the radiation upon the second integrated circuit,
where the determination component is configured to determine a health of the second integrated circuit based, at least in part, on a result of the second analysis,
where the selection component makes the selection, at least in part, through comparison of the health of the first integrated circuit against the health of the second integrated circuit,
where a report is outputted that indicates the health,
where the report indicates the health, at least in part, by way of indicating the healthier integrated circuit between the first integrated circuit and the second integrated circuit, and
where the analysis component, the determination component, the selection component, or a combination thereof is implemented, at least in part, by way of hardware.