US 11,671,732 B2
Optoelectronic systems and methods for inspection of optically encoded data
Bradley T Sako, Livermore, CA (US)
Filed by Bradley T Sako, Livermore, CA (US)
Filed on Aug. 2, 2021, as Appl. No. 17/392,196.
Application 17/392,196 is a continuation of application No. PCT/US2021/026064, filed on Apr. 6, 2021.
Application PCT/US2021/026064 is a continuation in part of application No. 16/842,740, filed on Apr. 7, 2020, granted, now 11,082,132.
Prior Publication US 2021/0368246 A1, Nov. 25, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. H04Q 11/00 (2006.01); H04J 14/02 (2006.01); H04B 10/516 (2013.01); G02B 6/27 (2006.01)
CPC H04Q 11/0062 (2013.01) [G02B 6/2773 (2013.01); H04B 10/516 (2013.01); H04J 14/0205 (2013.01); H04Q 2011/0081 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system, comprising:
a splitter configured to receive a first optical signal carrying first data and generate a first optical signal copy and second optical signal copy;
at least one optical processing path that includes
at least one optical encoder configured to transform the first optical signal copy into a second optical signal carrying the first data and an additional optical feature not present in the first optical signal,
at least one optical modulator configured to optically modulate the second optical signal according to a compare data to generate an optical match signal that indicates matches between the compare data and the first data, and
at least one photodetector configured to generate an electrical match signal in response to the optical match signal.