US 11,670,393 B2
Semiconductor devices for controlling repair operations
Dong Beom Lee, Icheon-si (KR); Eun Je Kim, Icheon-si (KR); and Hyeong Soo Jeong, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Nov. 12, 2021, as Appl. No. 17/525,315.
Claims priority of application No. 10-2021-0103266 (KR), filed on Aug. 5, 2021.
Prior Publication US 2023/0041988 A1, Feb. 9, 2023
Int. Cl. G11C 8/12 (2006.01); G11C 29/02 (2006.01)
CPC G11C 29/027 (2013.01) [G11C 8/12 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
a flag generation circuit configured to receive region fuse data and used fuse data which are generated from a fuse set selected based on a fuse set selection signal from among fuse sets and generate a bank resource flag to control a repair operation for a bank on which a repair operation has not been performed, based on the region fuse data and the used fuse data; and
a repair control circuit configured to control a repair operation for banks sharing the fuse sets based on the bank resource flag.