US 11,669,746 B2
System and method for active machine learning
Yue Deng, Sunnyvale, CA (US); Yilin Shen, Santa Clara, CA (US); and Hongxia Jin, San Jose, CA (US)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Mar. 29, 2019, as Appl. No. 16/370,542.
Claims priority of provisional application 62/656,210, filed on Apr. 11, 2018.
Prior Publication US 2019/0318261 A1, Oct. 17, 2019
Int. Cl. G06N 3/08 (2023.01); G06N 3/088 (2023.01); G06N 20/00 (2019.01); G06F 18/22 (2023.01); G06F 18/214 (2023.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/70 (2022.01)
CPC G06N 3/088 (2013.01) [G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06N 20/00 (2019.01); G06V 10/774 (2022.01); G06V 10/7715 (2022.01); G06V 10/82 (2022.01); G06V 20/70 (2022.01)] 25 Claims
OG exemplary drawing
 
1. A method for active learning, the method comprising:
mapping, by a feature encoder, entries in a data set including unlabeled data to a latent space;
selecting one or more entries from the data set including at least some of the unlabeled data based on a similarity between the one or more entries and labeled data, wherein selecting the one or more entries comprises determining that one or more similarity metrics associated with the one or more entries from the data set are at or above a threshold; and
labeling the one or more entries according to the similarity between the one or more entries and the labeled data.