CPC G06F 30/367 (2020.01) [G06N 7/005 (2013.01); G06F 2111/04 (2020.01); G06F 2111/10 (2020.01); G06F 2119/12 (2020.01)] | 18 Claims |
1. A method, comprising:
determining a set of measurements for a metric of an integrated circuit (IC) design by simulating the IC design over a set of random samples of random variables;
determining a first set of measurement margins based on the set of measurements, wherein each measurement margin corresponds to a difference between a measurement and a threshold;
constructing a Gaussian process (GP) model based on the first set of measurement margins, wherein the GP model predicts a second set of measurement margins that would be generated by simulating the IC design; and
determining, by a processor, a set of failure events for the IC design using the GP model, wherein each failure event corresponds to a set of values of the random variables that is expected to cause the metric of the IC design to violate the threshold.
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