US 11,669,649 B2
Support device
Yuki Itabayashi, Tokyo (JP); Makoto Onodera, Tokyo (JP); Yuuki Shimizu, Tokyo (JP); Akira Kamei, Tokyo (JP); and Masayuki Hariya, Tokyo (JP)
Assigned to HITACHI, LTD., Tokyo (JP)
Filed by Hitachi, Ltd., Tokyo (JP)
Filed on Dec. 15, 2020, as Appl. No. 17/121,793.
Claims priority of application No. JP2020-003780 (JP), filed on Jan. 14, 2020.
Prior Publication US 2021/0216673 A1, Jul. 15, 2021
Int. Cl. G06F 30/10 (2020.01); G06F 111/02 (2020.01); G06F 30/15 (2020.01); G06F 111/10 (2020.01)
CPC G06F 30/10 (2020.01) [G06F 30/15 (2020.01); G06F 2111/02 (2020.01); G06F 2111/10 (2020.01)] 8 Claims
OG exemplary drawing
 
1. A design support device, comprising:
a processor;
a display coupled to the processor;
a design rule database coupled to the processor; and
a memory coupled to the processor that stores instructions that when executed by the processor configure the processor to:
receive an input predetermined normal CAD data determined to be normal and predetermined violation CAD data determined to have a violated portion,
acquire attribute information including a vehicle type, a geographical region of the vehicle and a target object of a rule to be quantified,
search the normal CAD data and the violation CAD data based on the attribute information and the target object,
receive an input of a plurality of input parameters and acquire a plurality of numerical values of the acquired input parameters related to the design rule from the searched normal CAD data and the violation CAD data, and store the numerical values of the parameters in a table for each of the normal CAD data and violation CAD data,
perform a multiple regression analysis on the numerical values of the parameters stored in the table to calculate a value of an influence degree t that indicates a violation of each,
display, on the display, a list of the values of the influence degree t of each parameter,
receive a selection of a combination of two parameters having a highest and second highest value, respectively, of the influence degree t,
determine a scatter diagram plotting normal CAD data and violation CAD data to be evaluated based on the numerical values of the selected combination of the two parameters,
perform a cluster analysis on the scatter diagram and determine a boundary line,
simultaneously display, on the display, the scatter diagram and the boundary line on a two-dimensional coordinate system, and
register the coordinate system of parameters of the displayed combination of parameters and the boundary line as a threshold of a design rule in the design rule database.