US 11,668,752 B2
Ground fault interrupter self test circuits and related methods
Bruce G. Armstrong, San Mateo, CA (US); Rishi Pratap Singh, Orem, UT (US); Sanath Kumar Kondur Surya Kumar, Sandy, UT (US); and Riley Beck, Eagle Mountain, UT (US)
Assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed by SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Phoenix, AZ (US)
Filed on Mar. 1, 2022, as Appl. No. 17/652,979.
Application 17/652,979 is a continuation of application No. 16/458,368, filed on Jul. 1, 2019, granted, now 11,300,617.
Claims priority of provisional application 62/713,925, filed on Aug. 2, 2018.
Prior Publication US 2022/0268840 A1, Aug. 25, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/14 (2006.01); G01R 31/327 (2006.01); G01R 31/28 (2006.01); H02H 3/33 (2006.01); G01R 31/52 (2020.01); G01R 31/40 (2020.01); G01R 31/42 (2006.01); G01R 27/18 (2006.01); G01R 31/00 (2006.01); G01R 31/08 (2020.01); H02H 3/16 (2006.01)
CPC G01R 31/327 (2013.01) [G01R 27/18 (2013.01); G01R 31/006 (2013.01); G01R 31/086 (2013.01); G01R 31/2827 (2013.01); G01R 31/40 (2013.01); G01R 31/42 (2013.01); G01R 31/52 (2020.01); H02H 3/335 (2013.01); H02H 3/16 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A ground fault circuit interrupter self-test circuit comprising:
a current transformer coupled to a controller;
a silicon controlled rectifier (SCR) test loop coupled to the controller;
a ground fault test loop coupled to the controller; and
a solenoid coupled to the controller;
wherein the SCR test loop is configured to conduct an SCR self-test and the ground fault test loop is configured to conduct a ground fault self-test;
wherein an SCR is configured to activate the solenoid to deny power to a load upon one of the SCR self-test or the ground fault self-test being identified as failing; and
wherein one of the ground fault self-test or the SCR self-test fails two or more consecutive times before the SCR activates the solenoid.