US 11,668,750 B2
Performing testing utilizing staggered clocks
Sailendra Chadalavada, Saratoga, CA (US); Venkat Abilash Reddy Nerallapally, San Jose, CA (US); Jaison Daniel Kurien, Bangalore (IN); Bonita Bhaskaran, San Jose, CA (US); Milind Sonawane, Santa Clara, CA (US); Shantanu Sarangi, Saratoga, CA (US); and Purnabha Majumder, Lafayette, CA (US)
Assigned to NVIDIA CORPORATION, Santa Clara, CA (US)
Filed by NVIDIA Corporation, Santa Clara, CA (US)
Filed on Sep. 17, 2021, as Appl. No. 17/478,736.
Prior Publication US 2023/0089800 A1, Mar. 23, 2023
Int. Cl. G01R 31/3177 (2006.01); G06F 9/38 (2018.01); G06F 1/10 (2006.01); G01R 31/28 (2006.01); G06F 11/22 (2006.01); G06F 15/78 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); G06F 1/324 (2019.01); G01R 31/3185 (2006.01); G06F 1/3237 (2019.01); G06F 115/10 (2020.01)
CPC G01R 31/3177 (2013.01) [G01R 31/2851 (2013.01); G01R 31/31725 (2013.01); G01R 31/31727 (2013.01); G01R 31/31922 (2013.01); G01R 31/318594 (2013.01); G06F 1/10 (2013.01); G06F 1/324 (2013.01); G06F 1/3237 (2013.01); G06F 9/3885 (2013.01); G06F 11/2242 (2013.01); G06F 15/7864 (2013.01); G06F 2115/10 (2020.01)] 18 Claims
OG exemplary drawing
 
1. A method comprising, at a device:
during a first mode of operation of a computing element having a plurality of partitions, driving the computing element with a first clock having a first frequency;
detecting a second mode of operation of the computing element;
during the second mode of operation of the computing element:
driving the computing element with a second clock having a second frequency that is greater than the first frequency, and
while driving the computing element with the second clock, staggering scan clocks within the plurality of partitions of the computing element to form a plurality of different waveforms, the plurality of different waveforms each corresponding with a different partition of the plurality of partitions of the computing element and the plurality of different waveforms each shifted with respect to one another; and
performing testing of the computing element, utilizing the staggered scan clocks.