CPC G01Q 30/20 (2013.01) [G01Q 30/14 (2013.01)] | 25 Claims |
1. An atomic force microscope for evaluating a surface of a sample, comprising:
a sample holder comprising a first area configured to receive the sample fixedly mounted with respect to the first area,
a probe comprising a tip configured to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip with respect to the surface,
a support,
wherein
the sample holder has at least a second area distinct from the first area and fixed with respect to the support, the sample holder being deformable so as to authorize a relative displacement of the first area with respect to the second area,
the microscope comprises a detector configured to detect a displacement of the first area with respect to the second area,
the microscope being configured to evaluate an interaction between the surface and the tip base on a measurement of the displacement of the first area of the sample holder by the detector.
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