US 11,668,729 B2
Atomic force microscope
Antoine Niguès, Paris (FR); and Alessandro Siria, Paris (FR)
Assigned to Paris Sciences et Lettres; Centre National de la Recherche Scientifique (CNRS); Sorbonne Universite; and Université Paris Cité
Appl. No. 17/627,239
Filed by Paris Sciences et Lettres, Paris (FR); Centre National de la Recherche Scientifique (CNRS), Paris (FR); Sorbonne Universite, Paris (FR); and Université de Paris, Paris (FR)
PCT Filed Jul. 16, 2020, PCT No. PCT/EP2020/070156
§ 371(c)(1), (2) Date Jan. 14, 2022,
PCT Pub. No. WO2021/009290, PCT Pub. Date Jan. 21, 2021.
Claims priority of application No. 1908027 (FR), filed on Jul. 16, 2019.
Prior Publication US 2022/0236301 A1, Jul. 28, 2022
Int. Cl. G01Q 30/20 (2010.01); G01Q 30/14 (2010.01)
CPC G01Q 30/20 (2013.01) [G01Q 30/14 (2013.01)] 25 Claims
OG exemplary drawing
 
1. An atomic force microscope for evaluating a surface of a sample, comprising:
a sample holder comprising a first area configured to receive the sample fixedly mounted with respect to the first area,
a probe comprising a tip configured to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip with respect to the surface,
a support,
wherein
the sample holder has at least a second area distinct from the first area and fixed with respect to the support, the sample holder being deformable so as to authorize a relative displacement of the first area with respect to the second area,
the microscope comprises a detector configured to detect a displacement of the first area with respect to the second area,
the microscope being configured to evaluate an interaction between the surface and the tip base on a measurement of the displacement of the first area of the sample holder by the detector.