US 11,666,295 B2
Method of phase contrast imaging
Peiyan Cao, Shenzhen (CN); and Yurun Liu, Shenzhen (CN)
Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed by SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed on Jul. 13, 2022, as Appl. No. 17/863,676.
Application 17/863,676 is a continuation of application No. PCT/CN2020/076913, filed on Feb. 27, 2020.
Prior Publication US 2022/0346737 A1, Nov. 3, 2022
Int. Cl. A61N 5/10 (2006.01); A61B 6/00 (2006.01)
CPC A61B 6/484 (2013.01) [A61B 6/502 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method, comprising:
for i=1, . . . , M, sending a pencil radiation beam (i) toward an image sensor,
wherein the pencil radiation beam (i) is incident on an incident region (i) on the image sensor,
wherein the pencil radiation beam (i) is aimed at a target region (i) on the image sensor, wherein M is a positive integer,
wherein the image sensor comprises active areas spatially discontinuous from each other, and
wherein the incident regions (i), i=1, . . . , M and the target regions (i), i=1, . . . , M are on the active areas; and
for i=1, . . . , M, determining an offset (i) between the incident region (i) and the target region (i).