US 11,656,269 B2
Devices and methods for smart sensor application
GuangYang Qu, Beijing (CN); Yincai Tony Liu, Beijing (CN); Baotian Hao, Beijing (CN); Hanqing Wang, Beijing (CN); Hengfang Mei, Beijing (CN); Rengui Luo, Beijing (CN); Yimiao Zhao, Beijing (CN); and Junbiao Ding, Shanghai (CN)
Assigned to Analog Devices International Unlimited Company, Limerick (IE)
Filed by Analog Devices International Unlimited Company, Limerick (IE)
Filed on Aug. 31, 2021, as Appl. No. 17/463,103.
Application 17/463,103 is a division of application No. 16/584,212, filed on Sep. 26, 2019, granted, now 11,119,143.
Application 16/584,212 is a division of application No. 15/433,862, filed on Feb. 15, 2017, granted, now 10,466,296.
Application 15/433,862 is a continuation of application No. PCT/CN2017/070608, filed on Jan. 9, 2017.
Prior Publication US 2021/0405110 A1, Dec. 30, 2021
Int. Cl. G01R 31/28 (2006.01); G01N 27/416 (2006.01); G01N 33/00 (2006.01); G01R 27/02 (2006.01); G01R 27/16 (2006.01); G01R 35/00 (2006.01); G01N 27/12 (2006.01)
CPC G01R 31/2829 (2013.01) [G01N 27/4163 (2013.01); G01N 33/0057 (2013.01); G01R 27/02 (2013.01); G01R 27/16 (2013.01); G01R 35/005 (2013.01); G01N 27/122 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A test circuit for an electronic sensor, the test circuit comprising:
a load resistance connectable in series with the electronic sensor to form a series resistance of the load resistance and an internal impedance of the electronic sensor;
an excitation circuit configured to apply a predetermined voltage to a circuit element; and
a measurement circuit configured to:
initiate applying the predetermined voltage to the series resistance and determining the series resistance;
initiate applying the predetermined voltage to the load resistance and determining the load resistance; and
calculate the internal impedance of the electronic sensor using a difference of the determined series resistance and the load resistance, and provide the calculated internal impedance to a user or process.