US 11,967,482 B2
Charged particle beam device
Wen Li, Tokyo (JP); Hajime Kawano, Tokyo (JP); Momoyo Enyama, Tokyo (JP); and Makoto Sakakibara, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/435,118
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Mar. 8, 2019, PCT No. PCT/JP2019/009527
§ 371(c)(1), (2) Date Aug. 31, 2021,
PCT Pub. No. WO2020/183551, PCT Pub. Date Sep. 17, 2020.
Prior Publication US 2022/0102105 A1, Mar. 31, 2022
Int. Cl. H01J 37/153 (2006.01); H01J 37/147 (2006.01); H01J 37/20 (2006.01)
CPC H01J 37/153 (2013.01) [H01J 37/1475 (2013.01); H01J 37/20 (2013.01)] 4 Claims
OG exemplary drawing
 
1. A charged particle beam device comprising:
a charged particle gun that produces a primary beam;
a stage on which a sample is placed;
a detector that detects a secondary beam generated from the sample in response to the primary beam;
a multi-pole electromagnetic deflector that deflects a path of the secondary beam; and
a control circuit that controls the multi-pole electromagnetic deflector, wherein
the multi-pole electromagnetic deflector includes
electric field deflectors that generate an electric field, and
magnetic field deflectors of which number is the same as the number of the electric field deflectors and which generate a magnetic field,
the control circuit includes
electric field deflector drive circuits, each driving the electric field deflector,
a first astigmatism correction common voltage generating unit that controls the electric field deflector and outputs a first astigmatism correction voltage for carrying out astigmatism correction of the primary beam or the secondary beam,
magnetic field deflector drive circuits, each driving the magnetic field deflector,
a second astigmatism correction common voltage generating unit that controls the magnetic field deflector and outputs a second astigmatism correction voltage for carrying out astigmatism correction of the primary beam or the secondary beam,
an electric field-magnetic field common control voltage generating unit that outputs a deflection common voltage for deflecting a path of the secondary beam to the detector to the electric field deflector drive circuit and the magnetic field deflector drive circuit,
a first adder that adds the deflection common voltage and the first astigmatism correction voltage input directly or after adjustment and outputs a first added voltage to the electric field deflector drive circuit, and
a second adder that adds the deflection common voltage and the second astigmatism correction voltage input directly or after adjustment and outputs a second added voltage to the magnetic field deflector drive circuit.