US 11,966,288 B2
Electronic apparatus performing self-test using self-test application and control method thereof
Jaehoon Kim, Suwon-si (KR); Sungjun Kim, Suwon-si (KR); Kyuseon Son, Suwon-si (KR); Seunghee Shin, Suwon-si (KR); Myunggyun Yoon, Suwon-si (KR); and Youngchang Lee, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Feb. 10, 2022, as Appl. No. 17/668,813.
Application 17/668,813 is a continuation of application No. PCT/KR2022/001368, filed on Jan. 26, 2022.
Claims priority of application No. 10-2021-0019477 (KR), filed on Feb. 10, 2021.
Prior Publication US 2022/0253353 A1, Aug. 11, 2022
Int. Cl. G06F 11/10 (2006.01); G06F 11/263 (2006.01); G06F 11/27 (2006.01); G06F 11/32 (2006.01)
CPC G06F 11/1068 (2013.01) [G06F 11/263 (2013.01); G06F 11/27 (2013.01); G06F 11/327 (2013.01)] 11 Claims
OG exemplary drawing
 
8. A method of controlling an electronic apparatus, the method comprising:
implementing at least one function of the electronic apparatus by executing a program stored in a memory;
in response to occurrence of an error related to the function, executing a self-test application provided for a self-test of the error, and identifying a test routine for the error among one or more test routines, wherein the test routine comprises a test criterion for the error, the test criterion reflecting a status of the electronic apparatus in a manufacturing stage;
obtaining a test result of the error by testing the function based on the test routine; and
outputting information about the test result to be displayed.