US 11,965,926 B2
Electronic component test handler having flying scan function
Taek Seon Lee, Hwaseong (KR)
Assigned to ATECO INC., Gunpo (KR)
Appl. No. 17/438,889
Filed by ATECO INC., Gunpo (KR)
PCT Filed Apr. 8, 2020, PCT No. PCT/KR2020/004719
§ 371(c)(1), (2) Date Sep. 13, 2021,
PCT Pub. No. WO2020/213873, PCT Pub. Date Oct. 22, 2020.
Claims priority of application No. 10-2019-0043941 (KR), filed on Apr. 15, 2019.
Prior Publication US 2022/0146569 A1, May 12, 2022
Int. Cl. G01R 31/28 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); H01L 21/67 (2006.01); G06K 7/14 (2006.01)
CPC G01R 31/2867 (2013.01) [H01L 21/67259 (2013.01); H01L 21/67294 (2013.01); G06K 7/1404 (2013.01)] 12 Claims
OG exemplary drawing
 
1. An electronic device test handler comprising:
a hand provided to pick up, transfer, and place a plurality of devices; and
a scanner provided to scan a region at a predetermined angle on a transfer path of the plurality of devices,
wherein the transfer path is between a position where the hand picks up the plurality of devices and a position where the hand places the plurality of devices, and
wherein the scanner sequentially scans the plurality of devices one by one as the plurality of devices are passed by the hand through the scan region.