US 11,947,406 B2
Method, electronic device, and computer program product for memory fault prediction
Bing Liu, Tianjin (CN)
Assigned to DELL PRODUCTS L.P., Round Rock, TX (US)
Filed by DELL PRODUCTS L.P., Round Rock, TX (US)
Filed on Feb. 23, 2022, as Appl. No. 17/678,837.
Claims priority of application No. 202210030438.9 (CN), filed on Jan. 12, 2022.
Prior Publication US 2023/0222024 A1, Jul. 13, 2023
Int. Cl. G06F 11/00 (2006.01); G06F 11/07 (2006.01)
CPC G06F 11/008 (2013.01) [G06F 11/073 (2013.01); G06F 11/079 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for computer memory fault prediction, comprising:
generating a plurality of memory fault predictions for a memory over a period of time using reliability indicators for the memory, each fault being predicted based on a comparison of a prediction confidence with a confidence threshold;
determining an accuracy of the plurality of fault predictions over the period of time, the accuracy indicating an amount of work to reconstruct and diagnose predicted faulty memories after the fault prediction;
adjusting the confidence threshold in response to the accuracy being less than an accuracy threshold;
determining a detection rate of the fault prediction over the period of time;
adjusting the confidence threshold reversely in response to the detection rate being less than a detection rate threshold; and
migrating data out of the memory in response to the plurality of memory fault predictions for the memory.