US 11,942,939 B2
Apparatus and method for reducing temperature influence in measuring switching current
Sang Min Kim, Yongin-si (KR)
Assigned to Hyundai Mobis Co., Ltd., Seoul (KR)
Filed by HYUNDAI MOBIS CO., LTD., Seoul (KR)
Filed on Sep. 30, 2021, as Appl. No. 17/491,407.
Claims priority of application No. 10-2021-0029076 (KR), filed on Mar. 4, 2021.
Prior Publication US 2022/0286115 A1, Sep. 8, 2022
Int. Cl. H03K 3/011 (2006.01); H03F 3/45 (2006.01); H03H 7/06 (2006.01)
CPC H03K 3/011 (2013.01) [H03H 7/06 (2013.01); H03F 3/45475 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a current detector configured to detect a switching current of a power module flowing between a Kelvin pin and a source pin of the current detector and to output a voltage derived from a differential component of the switching current;
a resistor-capacitor filter configured to filter the voltage output from the current detector;
an integrator configured to integrate a voltage output from the filter;
an analog-to-digital converter (ADC) configured to convert an analog voltage output from the integrator into a digital voltage and to sample the digital voltage;
a scaler configured to apply a scaling constant to a sampled integrator output value output from the ADC and to output a sampled switching current; and
a compensator configured to remove a temperature dependent direct current resistance (DCR) effect from the sampled switching current,
wherein the filter is a high pass filter (HPF).