CPC G06T 7/0006 (2013.01) [G06T 1/0007 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01)] | 20 Claims |
1. A computer-implemented method for inspecting ICs, the computer-implemented method comprising:
receiving, by a controller, one or more images of a Device Under Test (DUT) from one or more imaging devices;
detecting, by the controller, observed features in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features;
inferring, by the controller, a presence of one or more first unobserved features, wherein the one or more first unobserved features are inferred using a mapping and inference model (MIM); and
adding, by the controller, the one or more first unobserved features to the first synthetic representation of the part design of the DUT.
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