US 11,941,330 B2
Modeling natural space environment effects on hardware
Kalen K. Omo, Waipahu, HI (US); Derek J. Van Damme, Tucson, AZ (US); Dmitry A. Lyapustin, Tucson, AZ (US); Hillary Aigbe Omoigui, Jr., Tucson, AZ (US); and Rondell J. Wilson, Vail, AZ (US)
Assigned to Raytheon Company, Tewksbury, MA (US)
Filed by Raytheon Company, Tewksbury, MA (US)
Filed on Jul. 29, 2020, as Appl. No. 16/942,343.
Prior Publication US 2022/0035964 A1, Feb. 3, 2022
Int. Cl. G06F 30/20 (2020.01); G06F 119/02 (2020.01)
CPC G06F 30/20 (2020.01) [G06F 2119/02 (2020.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
partitioning, by processing circuitry configured to implement a model for determining a value representing a probability that operation of an electronic part of a device will be upset by a single event effect (SEE), a trajectory of the device through a region into disjoint time segments;
determining, based on an effective shielding of the device and flux lookup tables (LUTs) for each of the time segments, respective SEE rates experienced by the electronic part for each time segment;
determining, based on the determined respective SEE rates and using the model, the probability is greater than a specified threshold;
responsive to the determining, adjusting the trajectory or the device until the probability is less than the specified threshold resulting in a new device or a new trajectory, respectively; and
(i) traversing, by the new device, the trajectory or (ii) traversing, by the device, the new trajectory.