US 11,940,577 B1
Wide bandgap semiconductor radiation detectors
Kanai S. Shah, Watertown, MA (US); Leonard Cirignano, Cambridge, MA (US); and Hadong Kim, Methuen, MA (US)
Assigned to Radiation Monitoring Devices, Inc., Watertown, MA (US)
Filed by Radiation Monitoring Devices, Inc., Watertown, MA (US)
Filed on Oct. 19, 2017, as Appl. No. 15/788,646.
Int. Cl. G01T 1/20 (2006.01); G01T 1/16 (2006.01); G01T 1/22 (2006.01); G01T 1/24 (2006.01); G01T 3/00 (2006.01); G01T 3/06 (2006.01); H01L 31/032 (2006.01); H01L 31/08 (2006.01)
CPC G01T 1/241 (2013.01) [G01T 1/16 (2013.01); G01T 1/2006 (2013.01); G01T 1/22 (2013.01); G01T 1/24 (2013.01); G01T 3/00 (2013.01); G01T 3/008 (2013.01); G01T 3/06 (2013.01); H01L 31/032 (2013.01); H01L 31/085 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A method for detecting radiation, comprising:
exposing a wide bandgap semiconductor to a source of radiation to generate an electrical signal and an optical signal; and
detecting radiation by measuring the electrical signal and the optical signal, wherein the optical signal measured is generated by Cherenkov light;
obtaining radiation timing information from the optical signal; and
obtaining radiation energy information from the electrical signal.