CPC G01R 31/309 (2013.01) [G01R 31/2831 (2013.01)] | 14 Claims |
1. A method for evaluating a semiconductor sample, comprising:
establishing a trained neural network that correlates Z-scan PMR data from the sample with at least one electronic transport property of the sample;
acquiring Z-scan PMR data from the sample; and
using the trained neural network to predict at least one electronic transport property of the sample from the acquired Z-scan PMR data.
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