US 11,929,448 B2
Electric injection annealing test device and a method thereof for crystalline silicon photovoltaic solar cells
Xianmin Zhang, Guangzhou (CN); Linlin Cai, Guangzhou (CN); and Shenghui Bai, Guangzhou (CN)
Assigned to South China University of Technology, Guangdong (CN)
Appl. No. 17/254,308
Filed by South China University of Technology, Guangdong (CN)
PCT Filed Oct. 22, 2018, PCT No. PCT/CN2018/111207
§ 371(c)(1), (2) Date Dec. 21, 2020,
PCT Pub. No. WO2020/000793, PCT Pub. Date Jan. 2, 2020.
Claims priority of application No. 201810683547.4 (CN), filed on Jun. 28, 2018.
Prior Publication US 2021/0119074 A1, Apr. 22, 2021
Int. Cl. H02S 50/15 (2014.01); H01L 21/66 (2006.01); H01L 31/18 (2006.01)
CPC H01L 31/1864 (2013.01) [H01L 22/30 (2013.01); H02S 50/15 (2014.12)] 9 Claims
OG exemplary drawing
 
1. An electric injection annealing test device for crystalline silicon photovoltaic solar cells, characterized in that, the test device comprises a dark box, a sample test bench, a temperature control device, a power supply device and an image acquisition device; the sample test bench, the temperature control device, the power supply device and the image acquisition device are located in the dark box; the sample test bench is used to place a solar cell sheet; the temperature control device is used to control a temperature of the solar cell sheet; the power supply device provides a current to the solar cell sheet, the image acquisition device is used to acquire electroluminescence images of the solar cell sheet under different temperatures and current conditions; wherein the image acquisition device comprises a camera, a camera holder, a camera fixing block and a slider; the camera is fixed on the camera holder through the camera fixing block; the camera slides on the camera holder through the slider.