US 11,927,689 B2
CFAR OS detection hardware with two sets of comparators
Sujaata Ramalingam, Bangalore (IN); Karthik Subburaj, Bangalore (IN); Pankaj Gupta, Dausa (IN); Anil Varghese Mani, Bangalore (IN); Karthik Ramasubramanian, Bangalore (IN); and Indu Prathapan, Bangalore (IN)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Jun. 18, 2021, as Appl. No. 17/351,750.
Claims priority of application No. 202041049954 (IN), filed on Nov. 17, 2020.
Prior Publication US 2022/0155368 A1, May 19, 2022
Int. Cl. G01S 7/292 (2006.01); G01S 7/40 (2006.01); G01S 13/524 (2006.01)
CPC G01S 7/2922 (2013.01) [G01S 7/4004 (2013.01); G01S 13/5246 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
loading data samples of a return target detection signal into a shift register of target detection circuitry, the shift register including a cell under test (CUT) and a first number of left window cells left out of the CUT and a second number of right window cells right of the CUT, wherein, as each data sample is loaded into the shift register, previously loaded data samples are shifted by one cell, at least each of the right window cells, each of the left window cells and the CUT contains a respective data sample;
computing a representative noise level by:
sorting data samples from the left window cells and the right window cells to create sorted data samples that are ranked in magnitude; and
selecting a Kth ranked data sample from among the sorted data samples as having the representative noise level, wherein a value of K is a first value when a number of valid data samples in the left and right window cells is a first number and is a second value when the number of valid data samples in the left and right window cells is a second number that is greater than the first number; and
comparing the data sample in the CUT to the representative noise level.