US 11,927,627 B2
Systems, methods, and devices for high-speed input/output margin testing
Daniel S. Froelich, Portland, OR (US); and Sam J. Strickling, Portland, OR (US)
Assigned to Tektronix, Inc., Beaverton, OR (US)
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Nov. 23, 2021, as Appl. No. 17/534,404.
Claims priority of provisional application 63/117,971, filed on Nov. 24, 2020.
Prior Publication US 2022/0163587 A1, May 26, 2022
Int. Cl. G06F 30/367 (2020.01); G01R 31/30 (2006.01); G01R 31/317 (2006.01); G01R 31/3181 (2006.01); G01R 31/3183 (2006.01); G01R 31/3185 (2006.01); G06F 115/12 (2020.01); G06F 119/06 (2020.01); G06F 119/12 (2020.01)
CPC G01R 31/31707 (2013.01) [G01R 31/30 (2013.01); G01R 31/31813 (2013.01); G01R 31/318314 (2013.01); G01R 31/318385 (2013.01); G01R 31/318572 (2013.01); G06F 30/367 (2020.01); G06F 2115/12 (2020.01); G06F 2119/06 (2020.01); G06F 2119/12 (2020.01)] 18 Claims
OG exemplary drawing
 
1. A test device, comprising:
at least one test interface structured to connect to a device under test (DUT);
one or more controllers structured to generate margin test signals for testing the DUT during one or more testing states of a test session;
a data repository structured to store results of the testing of the DUT during the one or more testing states of the test session along with a DUT identifier of the DUT tested during the test session;
the one or more controllers further structured to determine whether any results of the testing of the DUT match a predictive outcome, wherein the predictive outcome is generated from an analysis of results of previous testing of the DUT and one or more other DUTs as well as data about an operational lifetime of the one or more other DUTs; and
a user interface operatively coupled to the test device and structured to display an indication that the results of the testing of the DUT matched the predictive outcome, wherein the indication includes a predicted operational life of the DUT.