US 11,917,342 B2
Projection system and control method therefor
Taiyou Kimoto, Kanagawa (JP)
Assigned to SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
Appl. No. 17/756,133
Filed by SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
PCT Filed Nov. 13, 2020, PCT No. PCT/JP2020/042384
§ 371(c)(1), (2) Date May 18, 2022,
PCT Pub. No. WO2021/106617, PCT Pub. Date Jun. 3, 2021.
Claims priority of application No. 2019-215376 (JP), filed on Nov. 28, 2019.
Prior Publication US 2022/0417482 A1, Dec. 29, 2022
Int. Cl. H04N 9/31 (2006.01); G03B 21/14 (2006.01)
CPC H04N 9/3194 (2013.01) [G03B 21/142 (2013.01); H04N 9/312 (2013.01); H04N 9/3155 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A projection system, comprising:
an image formation apparatus configured to form image light;
a projection lens configured to project the image light on a screen;
a measurement apparatus configured to measure the image light;
a control apparatus configured to control the image formation apparatus based on an output of the measurement apparatus and perform calibration of the image light; and
a measurement assisting apparatus configured to switch between a first state and a second state, wherein
the measurement assisting apparatus is between the image formation apparatus and the projection lens,
the switch of the measurement assisting apparatus to the first state is based on projection of the image light onto the screen,
the switch of the measurement assisting apparatus to the second state is based on the calibration of the image light,
the first state corresponds to entrance of the image light in the projection lens, and
the second state corresponds to the entrance of the image light in the measurement apparatus.