CPC H01L 24/29 (2013.01) [H01L 23/3114 (2013.01); H01L 23/53228 (2013.01); H01L 2224/29155 (2013.01); H01L 2924/18161 (2013.01)] | 25 Claims |
1. A semiconductor chip comprising:
a semiconductor layer having a first surface;
a first insulating layer formed at the first surface of the semiconductor layer;
a conductive layer formed on the first insulating layer, the conductive layer made of a metal mainly containing Cu;
a second insulating layer formed on the first insulating layer, the second insulating layer covering the conductive layer, the second insulating layer having an opening from which a part of the conductive layer is exposed;
a Copper pillar extending in a thickness direction such that the Copper pillar is formed over the second insulating layer and the conductive layer, the Copper pillar made of a metal mainly containing Cu and electrically connected to the conductive layer through the opening;
an intermediate layer formed between the conductive layer and the Copper pillar, the intermediate layer made of a material having a linear expansion coefficient smaller than a linear expansion coefficient of the conductive layer and smaller than a linear expansion coefficient of the Copper pillar; and
a concave portion formed at one end surface of the Copper pillar, wherein the concave portion has a bottom surface opposed to the opening in the thickness direction and a side surface which extends upwardly in a convex arc shape from the bottom surface in a cross section, and wherein
an acute angle between a tangent line of a surface of the convex arc shape and a surface of the concave portion becomes steeper as the tangent line becomes closer to a side edge of the Copper pillar in a cross section.
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