US 11,913,240 B1
Measuring and marking system
Edward Kukuruda, Cerittos, CA (US)
Filed by Edward Kukuruda, Cerittos, CA (US)
Filed on May 2, 2022, as Appl. No. 17/734,119.
Application 17/734,119 is a continuation of application No. 16/915,030, filed on Jun. 29, 2020, granted, now 11,319,717.
Claims priority of provisional application 63/045,331, filed on Jun. 29, 2020.
Claims priority of provisional application 62/868,064, filed on Jun. 28, 2019.
This patent is subject to a terminal disclaimer.
Int. Cl. E04G 21/18 (2006.01); E04F 21/00 (2006.01); E04G 15/02 (2006.01); G01B 3/1089 (2020.01); G01B 3/1092 (2020.01); G01B 5/00 (2006.01); G01B 5/02 (2006.01)
CPC E04G 21/1891 (2013.01) [E04F 21/0015 (2013.01); E04G 15/02 (2013.01); E04G 21/1841 (2013.01); G01B 3/1089 (2020.01); G01B 3/1092 (2020.01); G01B 5/0004 (2013.01); G01B 5/02 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method comprising:
providing a template; wherein the template comprises:
a face; and
two or more indicators, wherein each indicator is located at one or more predetermined intervals on the face; and each indicator defines a window;
wherein each indicator is coded to indicate that each indicator is located at one of the one or more predetermined intervals; and the template defines a framing channel;
placing two plates in the framing channel;
marking the two plates through the window with a marking, wherein the window exposes at least a portion of each plate.