US 11,893,916 B2
Method for measuring temperature in integrated circuit, integrated circuit having temperature sensor, and display device
Yong Sung Ahn, Daejeon (KR); Hyo Joong Kim, Daejeon (KR); and Jae Sik Cho, Daejeon (KR)
Assigned to LX SEMICON CO., LTD., Daejeon (KR)
Filed by LX Semicon Co., Ltd., Daejeon (KR)
Filed on Oct. 12, 2022, as Appl. No. 17/964,640.
Claims priority of application No. 10-2021-0140521 (KR), filed on Oct. 20, 2021; and application No. 10-2022-0079599 (KR), filed on Jun. 29, 2022.
Prior Publication US 2023/0120028 A1, Apr. 20, 2023
Int. Cl. G09G 3/00 (2006.01); G01K 7/16 (2006.01)
CPC G09G 3/006 (2013.01) [G01K 7/16 (2013.01); G01K 2217/00 (2013.01); G09G 2330/045 (2013.01); G09G 2330/12 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method for measuring a temperature, the method comprising:
sensing a signal corresponding to a temperature by a temperature sensor included in an integrated circuit (IC);
identifying an amount of power consumed according to an operation of the IC;
generating a correction value corresponding to the identified amount of power; and
generating an estimate value of an ambient temperature based on the correction value and the signal sensed by the temperature sensor,
wherein a thermal resistance value of the temperature sensor is configured to be set based on a first amount of power consumed according to the operation of the IC and a first correction value corresponding to the first amount of power.