CPC G06F 3/0679 (2013.01) [G11C 29/08 (2013.01)] | 14 Claims |
1. A method for testing memory devices, the method comprising:
receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform;
selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method; and
executing the target testing method to test the memory device to be tested.
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