US 11,892,490 B2
System for measuring a microwave dielectric property of a solid material under force
Lixin Wu, Hunan (CN); Wenfei Mao, Hunan (CN); and Yuan Qi, Hunan (CN)
Assigned to CENTRAL SOUTH UNIVERSITY, Changsha (CN)
Filed by CENTRAL SOUTH UNIVERSITY, Hunan (CN)
Filed on Jan. 12, 2021, as Appl. No. 17/147,230.
Application 17/147,230 is a continuation of application No. PCT/CN2019/114394, filed on Oct. 30, 2019.
Claims priority of application No. 201910176614.8 (CN), filed on Mar. 8, 2019.
Prior Publication US 2021/0132130 A1, May 6, 2021
Int. Cl. G01R 27/26 (2006.01); G01N 3/06 (2006.01); G01N 3/12 (2006.01); G01N 22/00 (2006.01)
CPC G01R 27/2652 (2013.01) [G01N 3/066 (2013.01); G01N 3/12 (2013.01); G01N 22/00 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A system for measuring a microwave dielectric property of a solid material under force, comprising:
a microwave dielectric tester comprising an open coaxial resonator;
a pressure loading device;
a shield case for microwave electromagnetic shielding;
a spring seat; and
a computer;
wherein the microwave dielectric tester is connected to the spring seat; the pressure loading device is connected to the computer; the microwave dielectric tester and the pressure loading device are arranged inside the shield case, a sample is in contact with an upper portion of the microwave dielectric tester;
the pressure loading device is configured to load a horizontal pressure on the sample of the solid material; the microwave dielectric tester is configured to measure a dielectric constant and a dielectric loss of the sample under the horizontal pressure, and send measured dielectric constant and dielectric loss to the computer; the computer is configured to select a testing mode based on a test demand; the shield case is configured to shield an electromagnetic interference from an external environment; and the spring seat comprises an embedded spring that is attached to a bottom of the microwave dielectric tester, and the spring seat is configured to buffer the microwave dielectric tester against a compression caused by a deformation of the sample.